Gate-dependent carrier diffusion length in lead selenide quantum dot field-effect transistors.

We report a scanning photocurrent microscopy (SPCM) study of colloidal lead selenide (PbSe) quantum dot (QD) thin film field-effect transistors (FETs). PbSe QDs are chemically treated with sodium sulfide (Na2S) and coated with amorphous alumina (a-Al2O3) by atomic layer deposition (ALD) to obtain high mobility, air-stable FETs with a strongly gate-dependent conductivity. SPCM reveals a long photocurrent decay length of 1.7 μm at moderately positive gate bias that decreases to below 0.5 μm at large positive gate voltage and all negative gate voltages. After excluding other possible mechanisms including thermoelectric effects, a thick depletion width, and fringing electric fields, we conclude from photocurrent lifetime measurements that the diffusion of a small fraction of long-lived carriers accounts for the long photocurrent decay length. The long minority carrier lifetime is attributed to charge traps for majority carriers.